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Modern aberration-corrected transmission electron microscope (TEM) with appropriate electron beam energy is able to achieve atomic resolution imaging of single and bilayer graphene sheets. Especially, atomic confi guration of bilayer graphene with a rotation angle can be identifi ed from the direct imaging and phase reconstructed imaging since atomic resolution Moiré pattern can be obtained successfully at atomic scale using an aberrationcorrected TEM. This study boosts a reliable stacking order analysis, which is required for synthesized or artificially prepared multilayer graphene, and lets graphene researchers utilize the information of atomic confi guration of stacked graphene layers readily.