초록 close

We carried out an image analysis of living cells forming their contacts at the bottom of the cell culturing substrate. In order to visualize the contact area selectively, we adopted total-internal-reflection-fluorescence (TIRF) method, which can illuminate the specimen volume within only several hundred nano-meters above the substrate. From the fluorescent intensity of the TIRF image, we could calculate the distance of the cell surface from the substrate. As a result, we visualized the origin of cell contacts, their movements, and the change of cell-contact type from the close-contact into focal-contact with information of its vertical displacement representing the temporal evolution process of the three-dimensional cell-surface-profile near the contact area during this metamorphosis.