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We report depth pro ling of the critical current density and resistivity of YBa2Cu3O7 lms grown by in-situ electron beam evaporation. The method is capable of providing important information on the uniformity of the lms, and on the commonly observed property that the critical currents of coated conductor high temperature superconductor lms do not scale linearly with thickness. Local critical current density shows a clear correlation with local resistivity. Homogeneous transport properties with a large critical current density (4  5 MA/cm2 at 77 K, 0 T) are observed in the top faulted region, while it is found that the bottom part carries little supercurrent with a large local resistivity. Therefore, it is possible that thickness dependence of critical current density is a topological variation of good superconducting paths and/or grains in the thin- lm bodies. The information derived may be useful in the characterization and optimization of superconducting thin lms for electrical power and other applications.


We report depth pro ling of the critical current density and resistivity of YBa2Cu3O7 lms grown by in-situ electron beam evaporation. The method is capable of providing important information on the uniformity of the lms, and on the commonly observed property that the critical currents of coated conductor high temperature superconductor lms do not scale linearly with thickness. Local critical current density shows a clear correlation with local resistivity. Homogeneous transport properties with a large critical current density (4  5 MA/cm2 at 77 K, 0 T) are observed in the top faulted region, while it is found that the bottom part carries little supercurrent with a large local resistivity. Therefore, it is possible that thickness dependence of critical current density is a topological variation of good superconducting paths and/or grains in the thin- lm bodies. The information derived may be useful in the characterization and optimization of superconducting thin lms for electrical power and other applications.